The following CAVE3 papers will be presented at the ECTC, San Diego, May 26-29, 2015
Wednesday, May 27, 2015:
9:00AM (PST) – Session -37/ Paper -4: Failure Mechanisms and Color Stability in Light-Emitting Diodes during Operations in High-Temperature Environments in Presence of Contamination, Pradeep Lall and Hao Zhang- Auburn University; Lynn Davis RTI International
10:00AM (PST) – Session -3/ Paper -4: Thermal Cycling Reliability of Aged PBGA Assemblies- Comparison of Weibull Failure Data and Finite Element Model Predictions, Munshi M. Basit, Mohammad Motalab, Jeffery C. Suhling, Zhou Hai, John Evans, Michael J. Bozack, and Pradeep Lall- Auburn University
1:30PM (PST) – Session -10/ Paper -1: X-Ray Micro- CT and Digital- Volume Correlation Based Three- Dimensional Measurements of Deformation and Strain in Operational Electronics, Pradeep Lall and Junchao Wei- Auburn University
Thursday, May 28, 2015:
8:25AM (PST) – Session -15/ Paper -2: High Strain Rate Properties of SAC305 Lead Free Solder at High Operating Temperature after Long-Term Storage, Pradeep Lall, Di Zhang, and Jeff Suhling- Auburn University
2:00PM (PST) – Session -40/ Paper -8: Principal Components Regression Model for Prediction of Life-Reduction in SAC Lead Free Interconnects During Long-Term High Temperature Storage, Pradeep Lall, Sree Mitun Duraisamy, Jeff Suhling, and John Evans- Auburn University
3:55PM (PST) – Session -24/ Paper -5: Multiphysics- Modeling Corrosion in Copper-Aluminum Interconnects in High Humidity Environments, Pradeep Lall and Yihua Luo- Auburn University; Luu Nguyen- Texas Instruments, Inc.
Friday, May 29, 2015:
3:30PM (PST) – Session -36/ Paper-4: Nanomechanical Characterization of SAC Solder Joints- Reduction of Aging Effects Using Microalloy Additions, Md Hasnine, Jeffery C. Suhling, Barton C. Prorok, Michael J. Bozack, and Pradeep Lall- Auburn University